Measurement of nanoscale local stress distribution in phase-separated glass using scanning transmission electron microscopy-cathodoluminescence

被引：0
|
作者：
Yamada, Taiki [1 ]
Ohtsuka, Masahiro [1 ]
Takahashi, Yoshimasa [2 ,3 ]
Yoshino, Haruhiko [4 ]
Amma, Shin-ichi [5 ]
Muto, Shunsuke [3 ]
机构：
[1] Graduate School of Engineering, Nagoya University, Nagoya,464-8603, Japan
[2] Department of Mechanical Engineering, Kansai University, Osaka,564-8680, Japan
[3] Institute of Materials & Systems for Sustainability, Nagoya University, Nagoya,464-8603, Japan
[4] Innovative Technology Laboratories, AGC Inc., Kanagawa-ku,Yokohama,221-8755, Japan
[5] Materials Integration Laboratories, AGC Inc., Kanagawa-ku,Yokohama,221-8755, Japan
来源：
Materialia | 2020年 / 9卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Analysis of the spatial orientation distribution of building blocks in polycrystals as determined using transmission electron microscopy and a backscattered electron beam in a scanning electron microscope
    S. Yu. Mironov
    V. N. Danilenko
    M. M. Myshlyaev
    A. V. Korneva
    Physics of the Solid State, 2005, 47 : 1258 - 1266
  • [42] Real-time observation of nanoscale manipulation of metal oxide phase transformations using in situ transmission electron microscopy
    Yu, Lei
    Hudak, Bethany
    Han, Ruixin
    Waetzig, Gregory
    Depner, Sean
    Sang, Xiahan
    Liu, Jue
    Talapatra, Anjana
    Arroyave, Raymundo
    Page, Katharine
    Banerjee, Sarbajit
    Guiton, Beth
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 255
  • [43] Direct imaging of local atomic structures in zeolite using optimum bright-field scanning transmission electron microscopy
    Ooe, Kousuke
    Seki, Takehito
    Yoshida, Kaname
    Kohno, Yuji
    Ikuhara, Yuichi
    Shibata, Naoya
    SCIENCE ADVANCES, 2023, 9 (31)
  • [44] Studies of Local Structural Distortions in Strained Ultrathin BaTiO3 Films Using Scanning Transmission Electron Microscopy
    Park, Daesung
    Herpers, Anja
    Menke, Tobias
    Heidelmann, Markus
    Houben, Lothar
    Dittmann, Regina
    Mayer, Joachim
    MICROSCOPY AND MICROANALYSIS, 2014, 20 (03) : 740 - 747
  • [45] Multi-scale structuration of glasses: Observations of phase separation and nanoscale heterogeneities in glasses by Z-contrast scanning electron transmission microscopy
    Dargaud, Olivier
    Cormier, Laurent
    Menguy, Nicolas
    Patriarche, Gilles
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2012, 358 (10) : 1257 - 1262
  • [46] MICRO-RAMAN STUDY OF STRESS-DISTRIBUTION IN LOCAL ISOLATION STRUCTURES AND CORRELATION WITH TRANSMISSION ELECTRON-MICROSCOPY
    DEWOLF, I
    VANHELLEMONT, J
    ROMANORODRIGUEZ, A
    NORSTROM, H
    MAES, HE
    JOURNAL OF APPLIED PHYSICS, 1992, 71 (02) : 898 - 906
  • [47] Measurement of Local Si-Nanowire Growth Kinetics Using In situ Transmission Electron Microscopy of Heated Cantilevers
    Kallesoe, Christian
    Wen, Cheng-Yen
    Molhave, Kristian
    Boggild, Peter
    Ross, Frances M.
    SMALL, 2010, 6 (18) : 2058 - 2064
  • [48] 3D Strain Measurement of Heterostructures Using the Scanning Transmission Electron Microscopy Moire Depth Sectioning Method
    Wen, Huihui
    Zhang, Hongye
    Peng, Runlai
    Liu, Chao
    Liu, Shuman
    Liu, Fengqi
    Xie, Huimin
    Liu, Zhanwei
    SMALL METHODS, 2023, 7 (09)
  • [49] Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
    Muelller-Caspary, Knut
    Krause, Florian F.
    Grieb, Tim
    Loffler, Stefan
    Schowalter, Marco
    Beche, Armand
    Galioit, Vincent
    Marquardt, Dennis
    Zweck, Josef
    Schattschneider, Peter
    Verbeeck, Johan
    Rosenauer, Andreas
    ULTRAMICROSCOPY, 2017, 178 : 62 - 80
  • [50] Atomic-scale investigation of the heterogeneous structure and ionic distribution in an ionic liquid using scanning transmission electron microscopy
    Sugimori, Yuki
    Miyata, Tomohiro
    Hashiguchi, Hiroki
    Okunishi, Eiji
    Mizoguchi, Teruyasu
    RSC ADVANCES, 2019, 9 (19) : 10520 - 10527
12345