An ensemble-based deep semi-supervised learning for the classification of Wafer Bin Maps defect patterns

被引：0
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作者：
Manivannan, Siyamalan [1 ]
机构：
[1] Department of Computer Science, Faculty of Science, University of Jaffna, Sri Lanka
来源：
Computers and Industrial Engineering | 2022年 / 172卷
关键词：
461.4 Ergonomics and Human Factors Engineering - 714.2 Semiconductor Devices and Integrated Circuits - 716.1 Information Theory and Signal Processing - 723.2 Data Processing and Image Processing - 723.5 Computer Applications - 731 Automatic Control Principles and Applications - 951 Materials Science;
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摘要：
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