Polytypic quantum wells in Si and Ge: impact of 2D hexagonal inclusions on electronic band structure

被引:0
|
作者
Marzegalli, Anna [1 ]
Montalenti, Francesco [1 ]
Scalise, Emilio [1 ]
机构
[1] Univ Milano Bicocca, Dept Mat Sci, Via Roberto Cozzi 55, I-20125 Milan, Italy
关键词
STACKING-FAULTS; ENERGIES; DEFECTS;
D O I
10.1039/d4nh00355a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Crystal defects, traditionally viewed as detrimental, are now being explored for quantum technology applications. This study focuses on stacking faults in silicon and germanium, forming hexagonal inclusions within the cubic crystal and creating quantum wells that modify electronic properties. By modeling defective structures with varying hexagonal layer counts, we calculated the formation energies and electronic band structures. Our results show that hexagonal inclusions in Si and Ge exhibit a direct band gap, changing with inclusion thickness, effectively functioning as quantum wells. We find that Ge inclusions have a direct band gap and form type-I quantum wells. This research highlights the potential of manipulating extended defects to engineer the optoelectronic properties of Si and Ge, offering new pathways for advanced electronic and photonic device applications. This study reveals the impact of 2D hexagonal inclusions on Si and Ge, prompting their exploitation as light sources in Si photonics.
引用
收藏
页码:2320 / 2325
页数:6
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