End-to-End Direct Phase Retrieval From a Single-Frame Interferogram Based on Deep Learning

被引:1
|
作者
Zhang, Tianshan [1 ]
Lu, Mingfeng [1 ]
Hu, Yao [2 ]
Hao, Qun [4 ]
Wu, Jinmin [3 ]
Zhang, Nan [1 ]
Yang, Shuai [4 ]
He, Wenjie [1 ]
Zhang, Feng [1 ]
Tao, Ran [1 ]
机构
[1] Beijing Inst Technol, Sch Informat & Elect, Beijing Key Lab Fract Signals & Syst, Beijing 100081, Peoples R China
[2] Beijing Inst Technol, Sch Opt & Photon, Beijing Key Lab Precis Optoelect Measurement Instr, Beijing 100081, Peoples R China
[3] Beijing Informat Sci & Technol Univ, Sch Automat, Beijing 100101, Peoples R China
[4] Beijing Inst Technol, Sch Opt & Photon, MIIT Key Lab Complex Field Intelligent Explorat, Beijing, Peoples R China
基金
中国国家自然科学基金;
关键词
Deep learning; fringe analysis; optical interferometry; optical metrology; phase retrieval; DEMODULATION;
D O I
10.1109/TIM.2024.3418112
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the field of optical interferometry, phase retrieval is a critical step in acquiring the phase information of fringes. Various deep-learning-based methods have been proposed for phase retrieval from a single-frame interferogram. However, the existing methods still cannot obtain the unwrapped phase directly without the aid of extra steps. To truly fulfill end-to-end phase retrieval for various fringe patterns, we propose a novel method with carefully crafted network architecture and training methodology. Experimental results on simulated and actual interferograms show excellent accuracy, noise robustness, and demodulation efficiency without any further phase unwrapping or polynomial fitting required by the existing methods. Furthermore, the proposed method is compatible with non-Zernike-polynomial-phase interferograms containing phase discontinuities. These properties have qualified the proposed method for high-standard interferometric measurement for optical fabrication.
引用
收藏
页数:16
相关论文
共 50 条
  • [31] End-to-End Deep Learning for Robotic Following
    Pierre, John M.
    ICMSCE 2018: PROCEEDINGS OF THE 2018 2ND INTERNATIONAL CONFERENCE ON MECHATRONICS SYSTEMS AND CONTROL ENGINEERING, 2015, : 77 - 85
  • [32] End-to-end deep learning with neuromorphic photonics
    Dabos, G.
    Mourgias-Alexandris, G.
    Totovic, A.
    Kirtas, M.
    Passalis, N.
    Tefas, A.
    Pleros, N.
    INTEGRATED OPTICS: DEVICES, MATERIALS, AND TECHNOLOGIES XXV, 2021, 11689
  • [33] End-to-End Optimization of Deep Learning Applications
    Sohrabizadeh, Atefeh
    Wang, Jie
    Cong, Jason
    2020 ACM/SIGDA INTERNATIONAL SYMPOSIUM ON FIELD-PROGRAMMABLE GATE ARRAYS (FPGA '20), 2020, : 133 - 139
  • [34] Spline Filters For End-to-End Deep Learning
    Balestriero, Randall
    Cosentino, Romain
    Glotin, Herve
    Baraniuk, Richard
    INTERNATIONAL CONFERENCE ON MACHINE LEARNING, VOL 80, 2018, 80
  • [35] End-to-end Deep Learning of Optimization Heuristics
    Cummins, Chris
    Petoumenos, Pavlos
    Wang, Zheng
    Leather, Hugh
    2017 26TH INTERNATIONAL CONFERENCE ON PARALLEL ARCHITECTURES AND COMPILATION TECHNIQUES (PACT), 2017, : 219 - 232
  • [36] End-to-End Structural analysis in civil engineering based on deep learning
    Wang, Chen
    Song, Ling-han
    Fan, Jian-sheng
    AUTOMATION IN CONSTRUCTION, 2022, 138
  • [37] Deep Learning based End-to-End Rolling Bearing Fault Diagnosis
    Li, Yongjie
    Qiu, Bohua
    Wei, Muheng
    Sun, Wenqiushi
    Liu, Xueliang
    2019 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-QINGDAO), 2019,
  • [38] End-to-End Deep Reinforcement Learning based Recommendation with Supervised Embedding
    Liu, Feng
    Guo, Huifeng
    Li, Xutao
    Tang, Ruiming
    Ye, Yunming
    He, Xiuqiang
    PROCEEDINGS OF THE 13TH INTERNATIONAL CONFERENCE ON WEB SEARCH AND DATA MINING (WSDM '20), 2020, : 384 - 392
  • [39] A Deep Learning-Based End-To-End CT Reconstruction Method
    Lu, K.
    Ren, L.
    Yin, F.
    MEDICAL PHYSICS, 2020, 47 (06) : E507 - E508
  • [40] Optical Fiber Communication Systems Based on End-to-End Deep Learning
    Karanov, Boris
    Chagnon, Mathieu
    Aref, Vahid
    Lavery, Domanic
    Bayvel, Polina
    Schmalen, Laurent
    2020 IEEE PHOTONICS CONFERENCE (IPC), 2020,