Exploring a nanostructured X-ray optical device for improved spatial resolution in laboratory X-ray diffraction imaging

被引:0
|
作者
Yamanashi, Masaki [1 ]
机构
[1] Kyoto Municipal Inst Ind Technol & Culture, Metall Mat Lab, Bldg 9 South,Kyoto Res Pk 91 Chudoji Awata Cho, Kyoto 6008815, Japan
来源
关键词
X-ray diffraction imaging; X-ray optical devices; self-ordered nanostructure; anodization; porous anodic aluminium oxide; ANODIC POROUS ALUMINA; FABRICATION; SCATTERING;
D O I
10.1107/S1600576724005727
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Analytical methods with wide field range and high spatial resolution are required to observe the distribution of the crystal structure in micro-regions undergoing macroscopic chemical reactions. A recent X-ray diffraction (XRD) imaging method combines XRD with an X-ray optical device such as a glass polycapillary consisting of a bundle of numerous monocapillaries. The former provides the crystal structure, while the latter controls the shape of the incident or diffracted X-rays and retains the positional information of the sample. Although reducing the monocapillary pore size should improve the spatial resolution, manufacturing technology challenges must be overcome. Here, an anodic aluminium oxide (AAO) film, which forms self-ordered porous nanostructures by anodic oxidation in an electrolyte, is applied as an X-ray optical device. The AAO film (pore diameter: 110 nm; size of the disc: 11 mm; and thickness: 620 mm) was fabricated by anodization in a mixture of oxalic acid and ethylene glycol. The film was incorporated into a laboratory XRD instrument. Compared with using a glass polycapillary alone, using a combination of a glass polycapillary and the AAO film improved the spatial resolution of the XRD imaging method by 40%. This XRD imaging method should not only provide practical analysis in a laboratory environment but also support various observations of the crystal structure distribution.
引用
收藏
页码:1137 / 1144
页数:8
相关论文
共 50 条
  • [1] Exploring a nanostructured X-ray optical device for improved spatial resolution in laboratory X-ray diffraction imaging
    Yamanashi, Masaki
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2024, 57 (04): : 1137 - 1144
  • [2] Gain in spatial resolution of X-ray laboratory microtomographs with enlarging X-ray optical elements.
    Senin, R. A.
    Buzmakov, A. V.
    Konovko, A. V.
    Smirnov, I. S.
    Geranin, A. S.
    Asadchikov, V. E.
    9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2009, 186
  • [3] Realtime imaging in X-ray fluorescence and X-ray diffraction
    Sakurai, Kenji
    Mizusawa, Mari
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C183 - C184
  • [4] X-Ray diffraction imaging
    Hsu, R.
    Maslen, E.N.
    Australian and New Zealand Physicist, 1995, 32 (12):
  • [5] Enhancing resolution in coherent x-ray diffraction imaging
    Noh, Do Young
    Kim, Chan
    Kim, Yoonhee
    Song, Changyong
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2016, 28 (49)
  • [6] High-resolution X-ray diffraction and imaging
    Fewster, Paul F.
    Baidakova, Marina V.
    Kyutt, Reginald
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2013, 46 : 841 - 841
  • [7] A laboratory X-ray microbeam for combined X-ray diffraction and fluorescence measurements
    Rouziere, S.
    Jourdanneau, E.
    Kasmi, B.
    Joly, P.
    Petermann, D.
    Albouy, P. A.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2010, 43 : 1131 - 1133
  • [8] X-ray diffraction imaging provides nanometer spatial resolution for strain determination
    Di Fonzo, S
    Jark, W
    Lagomarsino, S
    Giannini, C
    De Caro, L
    Cedola, A
    Müller, M
    X-RAY MICROSCOPY, PROCEEDINGS, 2000, 507 : 505 - 510
  • [9] Parallel X-ray Imaging for Improving Spatial Resolution
    Kang, Sunghoon
    Gweon, Dae-Gab
    Toon, Kwon-Ha
    Chon, Kwon Su
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2011, 58 (06) : 1573 - 1576
  • [10] New CdTe quantum sensor, with improved spatial resolution, for fast X-ray and γ-ray imaging
    Gerstenmayer, JL
    Bonnin, O
    Gerbe, V
    Glasser, F
    Peyret, O
    SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS II, 1997, 487 : 281 - 286