High-resolution X-ray diffraction and imaging

被引：1
|
作者：
Fewster, Paul F. [1 ]
Baidakova, Marina V. [2 ]
Kyutt, Reginald [2 ]
机构：
[1] Sussex Innovat Ctr, PANalyt Res Ctr, Brighton BN1 9SB, E Sussex, England
[2] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 196140, Russia
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2013年 / 46卷
关键词：
D O I：
10.1107/S0021889813016415
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：841 / 841
页数：1
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