Image quality evaluation for FIB-SEM images (vol 293, pg 98, 2024)

被引：0
|
作者：
Roldan, D. [1 ]
Redenbach, C. [1 ]
Schladitz, K. [1 ]
Kubel, C. [1 ]
Schlabach, S. [1 ]
机构：
[1] Univ Nacl Colombia, Dept Matemat, Bogota, Colombia
来源：
JOURNAL OF MICROSCOPY | 2024年 / 296卷 / 01期
关键词：
D O I：
10.1111/jmi.13355
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：108 / 108
页数：1
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