Statistical modeling and assessment of storage reliability of 771 silicone seals for electrical connectors

被引：0
|
作者：
Qian, Ping [1 ]
Ding, Qiaoling [1 ]
Chen, Wenhua [1 ]
Chen, Tiantao [1 ]
Han, Kunkun [1 ]
机构：
[1] Zhejiang Sci Tech Univ, Zhejiang Prov Key Lab Reliabil Technol Mech & Elec, Hangzhou, Zhejiang, Peoples R China
来源：
ADVANCES IN MECHANICAL ENGINEERING | 2024年 / 16卷 / 09期
关键词：
Electrical connector; 771; silicone; accelerated degradation test; statistical modeling; response surface design;
D O I：
10.1177/16878132241284703
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
In order to assess the reliability of electrical connector seals under storage environment, the failure analysis of 771 silicone seals for electrical connectors under storage environment determines that the failure mechanism of 771 silicone seals is mainly hydrolysis and oxidation of silicone matrix material. Based on the response surface design theory, the combination of temperature and humidity stress levels was determined, and the accelerated degradation test program of seals under combined temperature and humidity stress was constructed. Using the accelerated degradation test data, the degradation trajectory model of 771 silicone seals, the failure life distribution model, and the accelerated equation that characterizes the mathematical relationship between temperature and humidity and the life index of 771 silicone seals are established and validated at the statistical level, which realizes the reliability assessment of 771 silicone seals for electrical connectors in storage environments.
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页数：14
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