Selective Scan Slice Grouping Technique for Efficient Test Data Compression

被引：0

作者：

Kim, Yongjoon ^{[1
]}

Park, Jaeseok ^{[1
]}

Kang, Sungho ^{[1
]}

机构：

[1] Yonsei Univ, Dept Elect & Elect Eng, Seoul 120749, South Korea

来源：

IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | 2010年 / E93D卷 / 02期

关键词：

design for testability (DfT); scan testing; SoC test; test data compression;

D O I：

10.1587/transinf.E93.D.380

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.

引用

页码：380 / 383

页数：4

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