Design of radiation-tolerant digital-to-analog converter and investigation on analog single event transient effects

被引：0

作者：

Suresh, Aishwarya Harneer ^{[1
]}

Carta, Corrado ^{[1
]}

Fischer, Gunter ^{[1
]}

机构：

[1] IHP Leibniz Inst High Performance Microelect, Technolpk 25, D-15236 Frankfurt, Germany

来源：

AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS | 2024年 / 187卷

关键词：

Space applications; Digital-to-analog converter DAC; SiGe BiCMOS technology; Radiation tolerance; Analog single event transients; ASETs;

D O I：

10.1016/j.aeue.2024.155503

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A circuit design methodology for space applications is presented with an 8-bit resistive digital-to-analog converter (DAC) with XY addressing mode and BiCMOS buffer designed in IHP's 130 nm SiGe BiCMOS technology (SG13S). The radiation tolerance of the implemented DAC is evaluated by circuit-level simulations particularly analyzing the radiation sensitivity of the DAC to analog single-event transients (ASETs). Radiation mitigation techniques are addressed. The total current consumption with a 3.3 V supply is 0.54 mA at a 1 MHz sampling frequency.

引用

页数：9

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