Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE OPEN JOURNAL OF INSTRUMENTATION AND MEASUREMENT

被引：0
|
作者：
Mukherjee, Anirban [1 ]
Gupta, Rajarshi [2 ]
Chatterjee, Amitava [3 ]
机构：
[1] Indian Inst Technol Kharagpur, Dept Elect Engn, Kharagpur 721302, India
[2] Univ Calcutta, Dept Appl Phys, Kolkata 700009, India
[3] Jadavpur Univ, Dept Elect Engn, Kolkata 700032, India
来源：
IEEE OPEN JOURNAL OF INSTRUMENTATION AND MEASUREMENT | 2023年 / 2卷
关键词：
D O I：
10.1109/OJIM.2023.3334827
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1 / 2
页数：2
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