Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE OPEN JOURNAL OF INSTRUMENTATION AND MEASUREMENT

被引：0

作者：

Mukherjee, Anirban ^{[1
]}

Gupta, Rajarshi ^{[2
]}

Chatterjee, Amitava ^{[3
]}

机构：

[1] Indian Inst Technol Kharagpur, Dept Elect Engn, Kharagpur 721302, India

[2] Univ Calcutta, Dept Appl Phys, Kolkata 700009, India

[3] Jadavpur Univ, Dept Elect Engn, Kolkata 700032, India

来源：

IEEE OPEN JOURNAL OF INSTRUMENTATION AND MEASUREMENT | 2023年 / 2卷

关键词：

D O I：

10.1109/OJIM.2023.3334827

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1 / 2

页数：2

共 50 条

[1] Special Section in IEEE Transactions on Instrumentation and Measurement on Biometric Instrumentation and Measurement
Scotti, Fabio
Zhang, David
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2010, 59 (04) : 750 - 751
[2] Guest Editorial Special Section on the 2022 IEEE International Instrumentation and Measurement Technology Conference
Rapuano, Sergio
Donnell, Kristen M.
Niewczas, Pawel
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 72
[3] Special Section on the 2007 IEEE International Symposium on Intelligent Signal Processing
Urena, Jesus
Varkonyi-Koczy, Annamaria R.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (08) : 2375 - 2376
[4] Guest Editorial Special Section on 2023 IEEE International Instrumentation and Measurement Technology Conference
Donnell, Kristen M.
Niewczas, Pawel
Abou-Khousa, Mohamed
Gunawan, Teddy Surya
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 73
[5] IEEE Open Journal of Signal Processing
不详
IEEE SIGNAL PROCESSING MAGAZINE, 2023, 40 (03) : 45 - 45
[6] First Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI testing - Future of Semiconductor Test
Das, SR
Rajsuman, R
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (05) : 1659 - 1661
[7] Predictive signal processing in instrumentation and measurement: A tutorial review
Ovaska, SJ
IMTC/97 - IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE: SENSING, PROCESSING, NETWORKING, PROCEEDINGS VOLS 1 AND 2, 1997, : 48 - 53
[8] Special Issue on the 2011 IEEE International Instrumentation and Measurement Technology Conference
Yan, Yong
Dyer, Ruth
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2012, 61 (05) : 1138 - 1139
[9] Special Issue on the 2017 IEEE International Instrumentation and Measurement Technology Conference
Rapuano, Sergio
Catunda, Sebastian Yuri
Yang, Wuqiang
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2018, 67 (05) : 982 - 983
[10] Special Issue on The 2016 IEEE International Instrumentation and Measurement Technology Conference
Flammini, Alessandra
Yan, Ruqiang
Lee, Huang-Chen
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2017, 66 (05) : 850 - 851

← 1 2 3 4 5 →