A Method for Simulating Mixed-Signal ATE Tests

被引：1

作者：

Sunter, Stephen ^{[1
]}

Zivkovic, Vladimir ^{[2
]}

Praselski, Bartlomiej ^{[1
]}

机构：

[1] Siemens Digital Ind Software, Ottawa, ON, Canada

[2] Infineon, Copenhagen, Denmark

来源：

2024 IEEE 42ND VLSI TEST SYMPOSIUM, VTS 2024 | 2024年

关键词：

analog test generation; IEEE P1687.2; IJTAG; DfT;

D O I：

10.1109/VTS60656.2024.10538577

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

It has never been practical to simulate production tests of mixed-signal ICs, except for the smallest ones. As a result, tests are written in the language of the intended automatic test equipment (ATE) and debugged on the ATE with (possibly defective) 'first silicon' devices - this typically requires months of effort. This paper shows why and how the Procedural Description Language (PDL) defined by IEEE P1687.2 can be used for writing tests that can be simulated before automatically and reliably translating them into ATE code. Examples are provided of automated translation to simulation testbenches that are compatible with manufacturing test limitations, as well as an example translation to (previously) digital-only IEEE 1450 STIL.

引用

页数：7

共 50 条

[1] ATE tests latest mixed-signal devices
Revue HF Tijdschrift, 1994, (3-4):
[2] An update on mixed-signal ATE software
Jacob, G
EE-EVALUATION ENGINEERING, 1995, 34 (12): : 50 - +
[3] WHAT TO LOOK FOR IN TOMORROWS MIXED-SIGNAL ATE
NORTON, EB
EE-EVALUATION ENGINEERING, 1994, 33 (12): : 22 - &
[4] MIXED-SIGNAL DEVICES INSPIRE NEW FOCUS IN ATE MARKET
WILLIAMSON, R
EE-EVALUATION ENGINEERING, 1994, 33 (04): : 36 - 37
[5] Mixed-signal algorithm tests transducers
Belousov, A
EDN, 1997, 42 (09) : 90 - +
[6] Formal description of test specification and ATE architecture for mixed-signal test
Deng, BL
Glauert, W
INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS, 2004, : 1081 - 1090
[7] Low-Distortion Signal Generation for Analog/Mixed-Signal Circuit Testing with Digital ATE
Kawabata, Masayuki
Asami, Koji
Shibuya, Shohei
Yanagida, Tomonori
Kobayashi, Haruo
2017 INTERNATIONAL TEST CONFERENCE IN ASIA (ITC-ASIA), 2017, : 2 - 7
[8] Mixed-Signal ATE Technology and its Impact on Today's Electronic System
Roberts, Gordon W.
PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2016,
[9] Automatic Verification of Mixed-Signal ATE Test Programs using Device Variation
Mayer, Franziska
Schott, Christian
Billich, Enrico
Yazdani, Saeid
Heinkel, Ulrich
Daler, Georg
Ruf, Bernhard
Pannuzzo, Ricardo
Dickenscheid, Wolfgang
2021 IEEE INTERNATIONAL TEST CONFERENCE (ITC 2021), 2021, : 374 - 379
[10] SOFTWARE CREATES ANALOG, MIXED-SIGNAL IC TESTS
NOVELLINO, J
ELECTRONIC DESIGN, 1992, 40 (10) : 104 - &

← 1 2 3 4 5 →