Comparable Study on Proton Radiation Effects for Amorphous and Crystalline Ge2Sb2Te5

被引:0
|
作者
Rao, Kai [1 ,2 ,3 ]
Wang, Yinghao [3 ]
Liu, Furong [4 ]
Ali, Zulfiqar [4 ]
Ma, Quanlong [4 ]
Wang, Feiying [4 ]
Ma, Yingqi [3 ,5 ]
机构
[1] Beijing Univ Technol, Inst Laser Engn, Beijing Engn Res Ctr Laser Technol, Key Lab Transscale Laser Mfg, Beijing 100124, Peoples R China
[2] Beijing Univ Technol, Inst Laser Engn, Fac Mat & Mfg, Beijing 100124, Peoples R China
[3] Chinese Acad Sci, Natl Space Sci Ctr, Beijing 100190, Peoples R China
[4] Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Laser Technol, Key Lab Transscale Laser Mfg Technol,Inst Laser En, Beijing 100124, Peoples R China
[5] Univ Chinese Acad Sci, Sch Astron & Space Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
Displacement damage; Ge2Sb2Te5; optical properties; phase-change material; proton irradiation; PHASE-CHANGE MATERIALS; RAMAN-SCATTERING; DISPLACEMENT; GETE; MECHANISM;
D O I
10.1109/TNS.2024.3400950
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Displacement damage to the structure and properties of phase-change materials caused by high-energy particle radiation is a major challenge to the development of optical storage systems for space applications. In this article, a 10 MeV proton irradiation was carried out on an amorphous and crystalline phase-change material of Ge2Sb2Te5 (namely, a-GeSbTe and c-GeSbTe), respectively, and radiation-induced local structural and optical property changes were then studied using Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) as well as a spectrophotometer. The results indicated that proton bombardment caused the partial breaking of the Sb-Te and Ge-Te bonds in both the a-GeSbTe and c-GeSbTe samples, but with a greater number of broken bonds in c-GeSbTe which led to an obvious drop in optical reflectivity together with an enhanced surface roughness as compared to a-GeSbTe. Stopping and range of ions in matter (SRIM) simulations further verified that c-GeSbTe experienced a higher degree of displacement damage, with peak damage values up to 3.3 x 10(-5) dpa. Meanwhile, vacancies in a-GeSbTe tended to gather toward the film bottom, while those in c-GeSbTe were commonly clustered near the film middle. This article provides crucial insights into understanding the response of Ge2Sb2Te5 to proton irradiation.
引用
收藏
页码:1300 / 1308
页数:9
相关论文
共 50 条
  • [41] EXAFS study of local order in the amorphous chalcogenide semiconductor Ge2Sb2Te5
    Paesler, M. A.
    Baker, D. A.
    Lucovsky, G.
    Edwards, A. E.
    Taylor, P. C.
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2007, 68 (5-6) : 873 - 877
  • [42] ELECTRONIC DIELECTRIC-CONSTANTS OF CRYSTALLINE AND AMORPHOUS GESB2TE4 AND GE2SB2TE5 SEMICONDUCTORS
    YOKOTA, R
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (08): : 1407 - 1411
  • [43] The Influence of Nitrogen Doping on the Chemical and Local Bonding Environment of Amorphous and Crystalline Ge2Sb2Te5
    Washington, J. S.
    Josep, E.
    Paesler, M. A.
    Lucovsky, G.
    Jordan-Sweet, J. L.
    Raoux, S.
    Chen, C. F.
    Pyzyna, A.
    Dasaka, R. K.
    Schrott, A.
    Lam, C.
    Ravel, B.
    Woicik, J.
    MATERIALS AND PHYSICS FOR NONVOLATILE MEMORIES, 2009, 1160 : 163 - +
  • [44] Ultrafast optical response of the amorphous and crystalline states of the phase change material Ge2Sb2Te5
    Miller, T. A.
    Rude, M.
    Pruneri, V.
    Wall, S.
    PHYSICAL REVIEW B, 2016, 94 (02)
  • [45] Mössbauer Studies of the Local Surrounding of Atoms in Amorphous and Crystalline Ge2Sb2Te5 Films
    G. A. Bordovskii
    A. V. Marchenko
    F. S. Nasredinov
    Yu. A. Petrushin
    P. P. Seregin
    Glass Physics and Chemistry, 2021, 47 : 166 - 172
  • [46] Cohesive and adhesive properties of ultrathin amorphous and crystalline Ge2Sb2Te5 films on polyimide substrates
    Schlich, Franziska F.
    Wyss, Andreas
    Galinski, Henning
    Spolenak, Ralph
    ACTA MATERIALIA, 2017, 126 : 264 - 271
  • [47] Phase separation of a Ge2Sb2Te5 alloy in the transition from an amorphous structure to crystalline structures
    Kim, YoungKuk
    Park, S. A.
    Baeck, J. H.
    Noh, M. K.
    Jeong, K.
    Cho, M. -H.
    Park, H. M.
    Lee, M. K.
    Jeong, E. J.
    Ko, D. -H.
    Shin, H. J.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2006, 24 (04): : 929 - 933
  • [48] The Mechanism of the Amorphous-to-Crystalline Transition in Ge2Sb2Te5 Ternary Alloys1
    J. González-Hernández
    V. Castaño
    A. del Real
    E. Morales-Sánchez
    E. García-García
    A. Mendoza-Galván
    E. F. Prokhorov
    Yu. V. Vorobiev
    Inorganic Materials, 2000, 36 : 1219 - 1227
  • [49] Study on the crystallization by an electrical resistance measurement in Ge2Sb2Te5 and N-doped Ge2Sb2Te5 films
    Hu, D. Z.
    Lu, X. M.
    Zhu, J. S.
    Yan, F.
    JOURNAL OF APPLIED PHYSICS, 2007, 102 (11)
  • [50] An experimental study of Ge diffusion through Ge2Sb2Te5
    Luong, Minh Anh
    Ran, Sijia
    Bernard, Mathieu
    Claverie, Alain
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2022, 152