Engineering nvCap From FEOL to BEOL with Ferroelectric Small-signal Non-destructive Read

被引:2
|
作者
Kim, Tae-Hyeon [1 ]
Luo, Yuan-Chun [1 ]
Phadke, Omkar [1 ]
Read, James [1 ]
Yu, Shimeng [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
关键词
Ferroelectrics; In-memory computing; Non-volatile memory; Back-end-of-line compatibility;
D O I
10.1109/IMW59701.2024.10536973
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Non-volatile ferroelectric capacitor (nvCap) that leverages the small-signal non-destructive read is a new concept to the ferroelectric memory family. nvCap overcomes the endurance limitation imposed by the destructive read in conventional ferroelectric random access memory (FeRAM) that relies on large-signal polarization switching. nvCap is also a promising candidate to enable the charge domain computation in a capacitive crossbar array for in-memory computing that only consumes dynamic power. The key engineering goal of nvCap is to optimize a asymmetric C-V characteristics to open up the large capacitance on/off ratio at DC zero voltage. In this invited paper, we present the progresses of our work on optimizing the nvCap device. We first introduce the HZO-based MFM nvCap that demonstrates the proof-of-concept, and present the FeFET-based MFS nvCap that improves capacitance on/off ratio with reliability/scaling analysis. Finally we report our new results on BEOL-compatible MFS nvCap based on a oxide semiconductor layer.
引用
收藏
页数:4
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