Swelling of Thin Graphene Oxide Film in Water Vapor Studied by In Situ Spectroscopic Ellipsometry

被引:0
|
作者
Zhou, Yi [1 ]
Bauer, Ralph A. [2 ]
Zhang, Xin [3 ]
Hong, Nina [4 ]
Verweij, Hendrik [1 ,3 ]
机构
[1] Ohio State Univ, Dept Mat Sci & Engn, Mars G Fontana Labs, Columbus, OH 43210 USA
[2] Global R&D Inc, Columbus, OH 43228 USA
[3] Nanjing Tech Univ, State Key Lab Mat Oriented Chem Engn, Nanjing 211816, Peoples R China
[4] JA Woollam Co Inc, Lincoln, NE 68508 USA
关键词
OPTICAL-PROPERTIES; ION-EXCHANGE; MEMBRANES; TRANSPORT; SEPARATION; DIFFUSION; HYDRATION; ALCOHOLS; SORPTION;
D O I
10.1021/acs.langmuir.4c00897
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Graphene oxide (GO) is obtained by the chemical treatment of graphene sheets, resulting in decoration with oxygen-containing functional groups. In the work presented here, we examined marked changes that occur in a thin film of parallel aligned GO sheets when exposed to water vapor at various pressures. It was found that exceptionally fast and substantial water uptake and release occur that is accompanied by major changes in GO interlayer spacing. These characteristics were obtained in situ with spectroscopic ellipsometry. At 99% relative humidity (RH) and 25 degrees C, the interlayer spacing became 1.41 nm, which recovers to similar to 0.8 nm within 30 s when exposed to 10% RH. Besides layer thickness values, uniaxial optical constants for the GO vs RH were derived from the ellipsometry data. Molar refraction theory was applied that indicated monolayer water formation at similar to 91% RH at 25 degrees C upon water adsorption. Our findings contribute to the understanding of the interaction between GO and its environment. The very outspoken effect of external water vapor pressure on GO water content, interlayer spacing, and optical properties can be utilized in sensing and separation devices, subnanometer positioning, chemical switches, and environmentally aware materials.
引用
收藏
页码:12497 / 12503
页数:7
相关论文
共 50 条
  • [31] Uniqueness test for thin film fitting in spectroscopic ellipsometry
    Wang, Zi-Yi
    Zhang, Rong-Jun
    Tang, Bin
    Sun, Yuan-Cheng
    Xu, Ji-Ping
    Zheng, Yu-Xiang
    Wang, Song-You
    Chen, Liang-Yao
    Fan, Hua
    Liao, Qing-Jun
    Wei, Yan-Feng
    Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves, 2015, 34 (06): : 663 - 667
  • [32] Uniqueness test for thin film fitting in spectroscopic ellipsometry
    Wang Zi-Yi
    Zhang Rong-Jun
    Tang Bin
    Sun Yuan-Cheng
    Xu Ji-Ping
    Zheng Yu-Xiang
    Wang Song-You
    Chen Liang-Yao
    Fan Hua
    Liao Qing-Jun
    Wet Yan-Feng
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 2015, 34 (06) : 663 - 667
  • [33] Temperature-dependent studies on the swelling behavior of thin polymer brush films with in situ infrared spectroscopic ellipsometry
    Furchner, Andreas
    Kroning, Annika
    Bittrich, Eva
    Rauch, Sebastian
    Koenig, Meike
    Uhlmann, Petra
    Eichhorn, Klaus-Jochen
    Hinrichs, Karsten
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 245
  • [34] Polymer multilayer film formation studied by in situ ellipsometry and electrochemistry
    Haberska, Karolina
    Ruzgas, Tautgirdas
    BIOELECTROCHEMISTRY, 2009, 76 (1-2) : 153 - 161
  • [35] Observation of SiC Oxidation in Ultra-thin Oxide Regime by In-situ Spectroscopic Ellipsometry
    Takaku, Toshiyuki
    Hijikata, Yasuto
    Yaguchi, Hiroyuki
    Yoshida, Sadafumi
    SILICON CARBIDE AND RELATED MATERIALS 2008, 2009, 615-617 : 509 - 512
  • [36] OPTICAL FUNCTIONS OF CHEMICAL-VAPOR-DEPOSITED THIN-FILM SILICON DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY
    JELLISON, GE
    CHISHOLM, MF
    GORBATKIN, SM
    APPLIED PHYSICS LETTERS, 1993, 62 (25) : 3348 - 3350
  • [37] Probing Swelling and Shrinking Process of Polystyrene Film by In-situ Ellipsometry
    Yang, Xiuyun
    Li, Jianpeng
    Liu, Yang
    Gao, Xiuxia
    MATERIALS PROCESSING TECHNOLOGY, PTS 1-3, 2012, 418-420 : 333 - +
  • [38] Physicochemical Analysis of Nanoscale Metal Oxide Thin Film Precursors via Infrared Spectroscopic Ellipsometry
    Koutsiaki, Christina
    Koutsogeorgis, Demosthenes C.
    Kalfagiannis, Nikolaos
    JOURNAL OF PHYSICAL CHEMISTRY C, 2023, 127 (32): : 15876 - 15886
  • [39] In situ ellipsometry studies of ZnS thin film growth
    Lee, S
    Park, BH
    Oh, SG
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (08): : 5346 - 5350
  • [40] In situ ellipsometry studies of ZnS thin film growth
    Ajou Univ, Suwon, Korea, Republic of
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1997, 36 (08): : 5346 - 5350