THz vs NIR laser-assisted atom probe tomography of LaB6 samples

被引:0
|
作者
Karam, M. [1 ]
Houard, J. [1 ]
Bhorade, O. [1 ]
Blum, I. [1 ]
Vella, A. [1 ]
机构
[1] Normandie Univ, Univ Rouen Normandie, INSA Rouen Normandie, CNRS,GPM UMR 6634, F-76000 Rouen, France
来源
APL MATERIALS | 2024年 / 12卷 / 07期
关键词
TERAHERTZ; EMISSION; DRIVEN; GENERATION; DESIGN; ENERGY; GAAS;
D O I
10.1063/5.0209916
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Terahertz (THz) radiation with low-energy photons (meV) is used in a wide range of applications, such as microscopy, sensing, and spectroscopy. However, recently, high amplitude THz pulses of MV/cm have been generated and used for electron emission and ion evaporation from field emitters, opening up the possibility of using high amplitude THz pulses for material imaging by THz-assisted atom probe tomography (APT). In this work, we compare the APT analyses of lanthanum hexaboride (LaB6) samples using a femtosecond near-infrared laser with those obtained using high-amplitude single-cycle THz pulses. The atomic-scale characterization of stoichiometric LaB6 is challenging in laser-assisted APT due to the detection losses of boron ions. Here, we show that the THz radiation reduces the emission of molecular ions and multiple detection events, and it increases the charge state of the emitted ions. All these effects result in an improvement in boron detection. Furthermore, the emission dynamics of boron and lanthanum ions differ in their evaporation times when using THz radiation. This work emphasizes the ability of high-amplitude, single-cycle THz pulses to well control material analysis in APT, leading to better results on chemical composition. It also paves the way for the use of this radiation for material manipulation. (c) 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 4.0 International (CC BY-NC-ND) license
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页数:7
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