Scanning Tunneling Microscopy for Molecules: Effects of Electron Propagation into Vacuum

被引:4
|
作者
Grewal, Abhishek [1 ]
Leon, Christopher C. [1 ]
Kuhnke, Klaus [1 ]
Kern, Klaus [1 ,2 ]
Gunnarsson, Olle [1 ]
机构
[1] Max Planck Inst Festkorperforsch, Heisenbergstr 1, D-70569 Stuttgart, Germany
[2] Inst Phys, Ecole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland
关键词
scanning tunneling microscopy; electronic transportgap; single molecule imaging; decoupling layer; thin insulator; phthalocyanine; NaCl; GENERALIZED EXPRESSION; DERIVATIVE RULE; RESOLUTION; ORIGIN; SIMULATION; EFFICIENT; SURFACE; MODEL;
D O I
10.1021/acsnano.3c12315
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Using scanning tunneling microscopy (STM), we experimentally and theoretically investigate isolated platinum phthalocyanine (PtPc) molecules adsorbed on an atomically thin NaCl(100) film vapor deposited on Au(111). We obtain good agreement between theory and constant-height STM topography. We theoretically examine why strong distortions of STM images occur as a function of distance between the molecule and the STM tip. The images of the highest occupied molecular orbital (HOMO) and the lowest unoccupied molecular orbital (LUMO) exhibit for increasing distance, significant radial expansion due to electron propagation in the vacuum. Additionally, the imaged angular dependence is substantially distorted. The LUMO image has substantial intensity along the molecular diagonals where PtPc has no atoms. In the electronic transport gap, the image differs drastically from HOMO and LUMO even at energies very close to these orbitals. As the tunneling becomes increasingly off-resonant, the eight angular lobes of the HOMO or of the degenerate LUMOs diminish and reveal four lobes with maxima along the molecular axes, where both, HOMO and LUMO have little or no weight. These images are strongly influenced by low-lying PtPc orbitals that have simple angular structures.
引用
收藏
页码:12158 / 12167
页数:10
相关论文
共 50 条
  • [31] Scanning tunneling microscopy of individual molecules: beyond imaging
    Gimzewski, JK
    Jung, TA
    Cuberes, MT
    Schlittler, RR
    SURFACE SCIENCE, 1997, 386 (1-3) : 101 - 114
  • [32] SnPc Molecules on Surfaces Studied by Scanning Tunneling Microscopy
    Li, Ruoning
    Wu, Tianhao
    Wang, Yifan
    Yuan, Chenyang
    Xue, Qiang
    Li, Na
    Hou, Shimin
    Wang, Yongfeng
    JOURNAL OF CLUSTER SCIENCE, 2019, 30 (05) : 1259 - 1266
  • [33] Scanning tunneling microscopy and spectroscopy investigations of QCA molecules
    Manimaran, M
    Snider, GL
    Lent, CS
    Sarveswaran, V
    Lieberman, M
    Li, ZH
    Fehlner, TP
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 55 - 63
  • [34] Identification of the conformation of individual molecules by scanning tunneling microscopy
    Fang, HB
    Giancarlo, LC
    Flynn, GW
    JOURNAL OF PHYSICAL CHEMISTRY B, 1999, 103 (27): : 5712 - 5715
  • [35] VACUUM TUNNELING OF SPIN-POLARIZED ELECTRONS DETECTED BY SCANNING TUNNELING MICROSCOPY
    WIESENDANGER, R
    BURGLER, D
    TARRACH, G
    WADAS, A
    BRODBECK, D
    GUNTHERODT, HJ
    GUNTHERODT, G
    GAMBINO, RJ
    RUF, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 519 - 524
  • [36] Scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy studies of selected videotapes
    Hammond, EC
    ATOMIC FORCE MICROSCOPY/SCANNING TUNNELING MICROSCOPY 2, 1997, : 215 - 226
  • [37] The theory of in situ scanning tunneling microscopy of redox molecules in the case of the fully adiabatic electron transitions
    Medvedev, Igor G.
    JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2007, 600 (01) : 151 - 170
  • [38] Transition voltage spectroscopy of scanning tunneling microscopy vacuum junctions
    Sotthewes, K.
    Hellenthal, C.
    Kumar, A.
    Zandvliet, H. J. W.
    RSC ADVANCES, 2014, 4 (61) : 32438 - 32442
  • [39] Si nanowire growth with ultrahigh vacuum scanning tunneling microscopy
    Ono, T
    Saitoh, H
    Esashi, M
    APPLIED PHYSICS LETTERS, 1997, 70 (14) : 1852 - 1854
  • [40] A low-temperature scanning tunneling microscopy investigation of single electron effects
    Drechsler, T
    Chi, LF
    Fuchs, H
    SCANNING, 1998, 20 (04) : 297 - 301