共 50 条
- [35] Application of line-scanning microscopy using a linear sensor in semiconductor industry: shape and thickness measurements OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VIII, 2013, 8788
- [38] Photobleaching Imprinting Enhanced Background Rejection in Line-Scanning Temporal Focusing Microscopy FRONTIERS IN CHEMISTRY, 2020, 8
- [40] Contrast and axial confinement enhancement in deep imaging via HiLo based line-scanning temporal focusing microscopy ADVANCES IN MICROSCOPIC IMAGING III, 2021, 11922