TOF-SIMS analysis: Application to ultra-thin AWA film on magnetic head

被引：0
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作者：
JIANG Zhicheng
LIU Yiwei WahFuk Chung
ChiYue Cheung
Ichiro Yagi
TIAN Hong Surface Analysis Laboratory SAE Magnetics H K Ltd SAE Tower Kwai Fung Crescent Kwai Chung N T Hong Kong China Visiting professor from Lanzhou Institute of Chemical Physics Chinese Academy of Sciences [38 ,42 ]
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ScienceinChina,SerA. | 2001年 / Ser.A.2001(S1)卷 / S1期
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TP333 [存贮器];
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摘要：
<正> F-containing polymer was coated on the magnetic head of hard disc drive (HDD) as theultra-thin (<20(?)) film of anti-wetting agent (AWA). A static TOF-SIMS method has been applied tomeasuring the thickness and coating uniformity of the ultra-thin film. TOF- SIMS is also used tostudy the micro-tribology and transfer of lubricant between the magnetic head and media interface.
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页码：393 / 399
页数：7
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