Exploiting device-level non-idealities for adversarial attacks on ReRAM-based neural networks

被引：0
|
作者：
McLemore, Tyler [1 ]
Sunbury, Robert [1 ]
Brodzik, Seth [1 ]
Cronin, Zachary [1 ]
Timmons, Elias [1 ]
Chakraborty, Dwaipayan [1 ]
机构：
[1] Department of Electrical and Computer Engineering, Rowan University, 201 Mullica Hill Rd, Glassboro,NJ,08028, United States
来源：
Memories - Materials, Devices, Circuits and Systems | 2023年 / 4卷
关键词：
461.4 Ergonomics and Human Factors Engineering - 525.2 Energy Conservation - 714.2 Semiconductor Devices and Integrated Circuits - 722.1 Data Storage; Equipment and Techniques;
D O I：
10.1016/j.memori.2023.100053
中图分类号：
学科分类号：
摘要：
121
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