Integrated Silicon Photonics OFDR System for High-Resolution Distributed Measurements Based on Rayleigh Backscattering

被引：2
|
作者：
Han, Gaoce [1 ,2 ]
Guo, Zhen [2 ]
Wang, Shumeng [1 ]
Du, Han [3 ]
Marco, James [2 ]
Greenwood, David [2 ]
Yu, Yifei [4 ]
Yan, Jize [1 ]
机构：
[1] Univ Southampton, Elect & Comp Sci ECS, Southampton SO17 1BJ, Hants, England
[2] Univ Warwick, Warwick Mfg Grp WMG, Coventry CV4 7AL, England
[3] Univ Southampton, Zepler Inst Photon & Nanoelect, Southampton SO17 1BJ, England
[4] Huazhong Univ Sci & Technol, Sch Mat Sci & Engn, Wuhan 430074, Peoples R China
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 2024年 / 42卷 / 09期
基金：
英国工程与自然科学研究理事会;
关键词：
Distributed optical fibre sensor; high spatial resolution; optical frequency domain reflectometry; Rayleigh backscattering; silicon photonics; silicon-on-insulator; FIBER;
D O I：
10.1109/JLT.2024.3350079
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Optical frequency domain reflectometry (OFDR) has high spatial resolution and measurement accuracy, driving its popularity in various fields. Integration of OFDR technology has made it accessible, cost-effective and deployable in many applications, including battery management and photonic integrated circuits. An integrated OFDR system based on Rayleigh backscattering and silicon photonics technology on an SOI platform has been developed for the first time. The system's simplified configuration was simulated, fabricated and characterized in detail, achieving an experimental spatial resolution of 8.28 mu m, matching the theoretical level. This system shows high potential for sensing, monitoring and detection where precise spatial information is crucial. OFDR's accessibility and high performance in distributed measurements make it a promising technology for future advancements.
引用
收藏
页码：3482 / 3493
页数：12
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