A framework for process states structural interpretation of zero-defect manufacturing

被引:0
|
作者
Xu, Zihan [1 ]
Guo, Zhengang [1 ]
Zhang, Geng [1 ]
Zhou, Xueliang [2 ]
Zhang, Yingfeng [1 ]
机构
[1] Northwestern Polytech Univ, Sch Mech Engn, Key Lab Ind Engn & Intelligent Mfg, Xian, Shaanxi, Peoples R China
[2] Hubei Univ Automot Technol, Sch Elect & Informat Engn, Shiyan 442002, Peoples R China
基金
中国博士后科学基金; 美国国家科学基金会; 中国国家自然科学基金;
关键词
Zero -defect manufacturing; Cyber-physical system; Low -rank representation; Quality assurance; Sustainable production paradigm; Process states interpretation; SYSTEMS;
D O I
10.1016/j.aei.2024.102442
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Recent advances in quality manufacturing research have focused on the industrial landing of Zero-defect Manufacturing (ZDM) which is aiming toward a more precise, robust, and sustainable production paradigm. A systematic deployment platform for ZDM implementation need to take advantage of the various advanced technologies and integrate them. Cyber-physical system (CPS) is a critical framework and low-rank representation (LRR) is the method which has widely used in computer vision, signal processing and other research areas. This paper describes a novel framework based on the interdisciplinary integration of cyber-physical architecture and low-rank representation, which is named the CPS-ZDM-LRR framework. It transforms the quality control problem into the signal monitoring, to complete the process states interpretation and deal with the hidden defect problem in ZDM. Through the continuous monitoring of products and equipment' status during manufacturing process, the real-time raw data from different sources has been preprocessed to the time series features which are slide keyframe matrices, and LRR used to search the low-rank structure of slide keyframe matrices which can help us recognize the current status of manufacturing system deeply and give the preventive measures suggestion for quality assurance. Finally, an simulation experiment will validate our framework and show its performance in zero-defect manufacturing.
引用
收藏
页数:10
相关论文
共 50 条
  • [31] Safety Poka Yoke in Zero-Defect Manufacturing Based on Digital Twins
    Lv, Zhihan
    Guo, Jinkang
    Lv, Haibin
    IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2023, 19 (02) : 1176 - 1184
  • [32] Towards Zero-Defect Manufacturing in the Silicon Wafer Production Through Calibration Measurement Process: An Italian Case
    Acerbi, Federica
    Pranzo, Andrea
    Sanna, Cristina
    Spaltini, Marco
    Taisch, Marco
    PRODUCT LIFECYCLE MANAGEMENT: LEVERAGING DIGITAL TWINS, CIRCULAR ECONOMY, AND KNOWLEDGE MANAGEMENT FOR SUSTAINABLE INNOVATION, PT II, PLM 2023, 2024, 702 : 355 - 364
  • [33] Creating zero-defect students
    Faculty of Engineering, University of Manitoba, Canada
    不详
    TQM Mag, 4 (287-291):
  • [34] Role of Industry 4.0 in zero-defect manufacturing: A systematic literature review and a conceptual framework for future research directions
    Hossain, Md Monir
    Purdy, Gregory
    MANUFACTURING LETTERS, 2024, 41 : 1696 - 1707
  • [35] QUEST FOR ZERO-DEFECT SERVICE - WINNING WAYS - ACHIEVING ZERO-DEFECT SERVICE - HOROVITZ,J
    不详
    TRAINING AND DEVELOPMENT JOURNAL, 1991, 45 (04): : 83 - 84
  • [36] Zero-defect manufacturing the approach for higher manufacturing sustainability in the era of industry 4.0: a position paper
    Psarommatis, Foivos
    Sousa, Joao
    Mendonca, Joao Pedro
    Kiritsis, Dimitris
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2022, 60 (01) : 73 - 91
  • [37] Zero-Defect Manufacturing and Automated Defect Detection Using Time of Flight Diffraction (TOFD) Images
    Subramaniam, Sulochana
    Kanfoud, Jamil
    Gan, Tat-Hean
    MACHINES, 2022, 10 (10)
  • [38] Integration Challenges for the Deployment of a Multi-Stage Zero-Defect Manufacturing Architecture
    Angione, Giacomo
    Cristalli, Cristina
    Barbosa, Jose
    Leitao, Paulo
    2019 IEEE 17TH INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN), 2019, : 1615 - 1620
  • [39] Reduced order models for uncertainty management and zero-defect control in seal manufacturing
    Viejo Monge, Ismael
    Alcala Serrano, Noelia
    Izquierdo, Salvador
    Conde Vallejo, Ignacio
    Zambrano, Valentina
    Gracia Grijota, Leticia A.
    2019 IEEE 17TH INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN), 2019, : 1627 - 1630
  • [40] Application of automation for in-line quality inspection, a zero-defect manufacturing approach
    Azamfirei, Victor
    Psarommatis, Foivos
    Lagrosen, Yvonne
    JOURNAL OF MANUFACTURING SYSTEMS, 2023, 67 : 1 - 22