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- [4] PROPERTIES OF INTERFACE CHARGE INHOMOGENEITIES IN THERMALLY GROWN SI-SIO2 STRUCTUREAPPLIED PHYSICS LETTERS, 1976, 28 (11) : 678 - 681ZIEGLER, KKLAUSMANN, E
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- [6] Si-SiO2 electronic interface roughness as a consequence of Si-SiO2 topographic interface roughnessJ Electrochem Soc, 3 (1021-1025):LSI/PEE/EPUSP, Sao Paulo, Brazil
- [7] Si-SiO2 electronic interface roughness as a consequence of Si-SiO2 topographic interface roughnessJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (03) : 1021 - 1025Lopes, MCVdosSantos, SGHasenack, CMBaranauskas, V
- [8] METASTABILITIES OF SI-SIO2 INTERFACEBULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 462 - 463WHITE, CTNGAI, KL
- [9] MORPHOLOGY OF SI-SIO2 INTERFACESURFACE SCIENCE, 1980, 98 (1-3) : 154 - 166SUGANO, TCHEN, JJHAMANO, T