HIGH-POWER AGING TESTS OF 1.3-MU-M AND 1.5-MU-M VIPS LASERS

被引：7
|
作者：
OSHIBA, S
KAWAI, Y
机构：
来源：
ELECTRONICS LETTERS | 1987年 / 23卷 / 16期
关键词：
D O I：
10.1049/el:19870596
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：843 / 844
页数：2
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