STRUCTURAL AND CHEMICAL CHARACTERIZATION OF SEMICONDUCTOR INTERFACES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：0

作者：

OURMAZD, A

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来源：

POINT AND EXTENDED DEFECTS IN SEMICONDUCTORS | 1989年 / 202卷

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O59 [应用物理学];

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引用

页码：135 / 151

页数：17

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