MEASUREMENT OF 3-D DISPLACEMENT - SANDWICH HOLOGRAPHY AND REGULATED PATH-LENGTH INTERFEROMETRY

被引：0
|
作者：
FUZESSY, Z [1 ]
ABRAMSON, N [1 ]
机构：
[1] TECH UNIV BUDAPEST,INST PHYS,H-1521 BUDAPEST,HUNGARY
来源：
APPLIED OPTICS | 1982年 / 21卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：260 / 264
页数：5
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