X-RAY ANALYSIS AT HIGH AND LOW TEMPERATURES

被引：0
|
作者：
KUZNETSOV, VG
机构：
来源：
JOURNAL OF INORGANIC CHEMISTRY-USSR | 1956年 / 1卷 / 07期
关键词：
D O I：
暂无
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
引用
收藏
页码：95 / 106
页数：12
相关论文
共 50 条
  • [31] X-RAY POWDER CAMERA FOR TAKING PHOTOGRAPHS AT LOW-TEMPERATURES
    BUERGER, MJ
    SHOEMAKER, GL
    AMERICAN MINERALOGIST, 1978, 63 (9-10) : 824 - 826
  • [32] X-ray diffraction study of MgB2 at low temperatures
    Xue, Y
    Asada, S
    Hosomichi, A
    Naher, S
    Xue, J
    Kaneko, H
    Suzuki, H
    Muranaka, T
    Akimitsu, J
    JOURNAL OF LOW TEMPERATURE PHYSICS, 2005, 138 (5-6) : 1105 - 1115
  • [33] X-RAY LINE BROADENING FROM METALS DEFORMED AT LOW TEMPERATURES
    PATERSON, MS
    ACTA METALLURGICA, 1954, 2 (06): : 823 - 830
  • [34] X-RAY DIFFRACTION STUDY OF SOME SYNTHETIC RUBBERS AT LOW TEMPERATURES
    HANSON, EE
    HALVERSON, G
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1948, 70 (02) : 779 - 783
  • [35] X-ray Diffraction Study of MgB2 at Low Temperatures
    Y. Xue
    S. Asada
    A. Hosomichi
    S. Naher
    J. Xue
    H. Kaneko
    H. Suzuki
    T. Muranaka
    J. Akimitsu
    Journal of Low Temperature Physics, 2005, 138 : 1105 - 1115
  • [36] X-Ray Diffraction Study of Correlated Electron System at Low Temperatures
    Haruhiko Suzuki
    Yun Xue
    Akiko Hosomichi
    Shumsun Naher
    Fumiaki Hata
    Hiroshi Kaneko
    Journal of Superconductivity and Novel Magnetism, 2006, 19 : 89 - 94
  • [37] In-situ X-ray stress analysis at high temperatures in CVD steel substrate compounds
    Tomala, V.
    Hirsch, T.
    Mayr, P.
    HTM - Haerterei-Technische Mitteilungen, 2000, 55 (02):
  • [38] In situ X-ray stress analysis at high temperatures in CVD steel-substrate compounds
    Tomala, V
    Hirsch, T
    Mayr, P
    SURFACE ENGINEERING, 1999, 15 (01) : 59 - 63
  • [39] X-ray temperatures of lensing clusters
    Hjorth, J
    Oukbir, J
    van Kampen, E
    PHYSICA SCRIPTA, 1998, T77 : 111 - 113
  • [40] ATTAINMENT OF HIGH RESOLUTION IN X-RAY FLUORESCENT ANALYSIS - SIMPLIFICATION OF X-RAY FLUORESCENT ANALYSIS PROCEDURES
    BRISSEY, RM
    ANALYTICAL CHEMISTRY, 1952, 24 (06) : 1034 - 1035
12345