MICHELSON INTERFEROMETER USING ELECTRON WAVES

被引:14
|
作者
LICHTE, H
WAHL, H
MOLLENSTEDT, G
机构
来源
ZEITSCHRIFT FUR PHYSIK | 1972年 / 249卷 / 05期
关键词
D O I
10.1007/BF01386775
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:456 / +
页数:1
相关论文
共 50 条
  • [31] FIBEROPTIC MICHELSON INTERFEROMETER USING AN OPTICAL POWER DIVIDER
    IMAI, M
    OHASHI, T
    OHTSUKA, Y
    OPTICS LETTERS, 1980, 5 (10) : 418 - 420
  • [32] FOURIER-TRANSFORM SPECTROSCOPY USING A MICHELSON INTERFEROMETER
    ALBERGOTTI, JC
    AMERICAN JOURNAL OF PHYSICS, 1972, 40 (08) : 1070 - +
  • [33] Measurement of Young's Modulus Using a Michelson Interferometer
    Noh, Jae June
    Kim, Soyeon
    Kim, Jung Bog
    PHYSICS TEACHER, 2023, 61 (07): : 618 - 620
  • [34] Planar Michelson Interferometer Using Terahertz Surface Plasmons
    Gerasimov, V. V.
    Nikitin, A. K.
    Lemzyakov, A. G.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2023, 66 (03) : 423 - 434
  • [35] Calibration of optical phase shifter using a Michelson interferometer
    Shi, WF
    Tipton, D
    May, R
    Claus, R
    HOLOGRAPHIC OPTICAL ELEMENTS AND DISPLAYS, 1996, 2885 : 220 - 227
  • [36] LIGHT MODULATOR USING A VIBRATING MIRROR IN A MICHELSON INTERFEROMETER
    COLBURN, S
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (03): : 192 - 194
  • [37] Refraction and dispersion measurement using dispersive Michelson interferometer
    Medhat, M.
    El-Zaiat, S. Y.
    Omar, M. F.
    Farag, S. S.
    Kamel, S. M.
    OPTICS COMMUNICATIONS, 2017, 393 : 275 - 283
  • [38] MEASUREMENT OF SI EPITAXIAL THICKNESS USING A MICHELSON INTERFEROMETER
    COX, PF
    STALDER, AF
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (02) : 287 - 292
  • [39] Optical displacement measurement using a monolithic Michelson interferometer
    Hofstetter, D
    Zappe, HP
    MINIATURIZED SYSTEMS WITH MICRO-OPTICS AND MICROMECHANICS II, 1997, 3008 : 142 - 151
  • [40] An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers
    Hilbert, Vinzenz
    Blinne, Alexander
    Fuchs, Silvio
    Feigl, Torsten
    Kaempfer, Tino
    Roedel, Christian
    Uschmann, Ingo
    Wuensche, Martin
    Paulus, Gerhard G.
    Foerster, Eckhart
    Zastrau, Ulf
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (09):