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- [43] EX-SITU AND INSITU STUDIES OF THE REDUCTION OF NICKEL-OXIDE SINGLE-CRYSTALS USING TRANSMISSION ELECTRON-MICROSCOPYJOURNAL OF METALS, 1979, 31 (12): : 57 - 57LITTLE, JAEVANS, JWWESTMACOTT, K
- [44] ELECTRON-MICROSCOPY OF DISLOCATION-STRUCTURE IN PLASTICALLY DEFORMED CU-5 AT PERCENT AL SINGLE-CRYSTALSACTA METALLURGICA, 1975, 23 (02): : 155 - 163KARNTHALER, HPPRINZ, FHASLINGER, G
- [45] DISLOCATIONS IN DEFORMED ZNSE SINGLE-CRYSTALS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPYPHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 75 (01): : 101 - 106ARISTOV, VVZARETSKII, AVOSIPYAN, YAPETRENKO, VFSTRUKOVA, GKKHODOS, II
- [46] ELECTRON-MICROSCOPY OF TAS2 SINGLE-CRYSTALS USING WEAK BEAM TECHNIQUEINDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1980, 18 (11) : 899 - 902AGARWAL, MKPATEL, JVPATEL, TC
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- [48] ORIGIN OF CONTRAST EFFECTS IN ELECTRON-MICROSCOPY OF POLYMERS .1. POLYETHYLENE SINGLE-CRYSTALSJOURNAL OF MATERIALS SCIENCE, 1972, 7 (02) : 131 - &GRUBB, DTGROVES, GWKELLER, A
- [49] SOME REMARKS ON DEFECT STRUCTURE IN HGTE CRYSTALS REVEALED BY TRANSMISSION ELECTRON-MICROSCOPYPHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 34 (02): : K107 - &MIZERA, EKLIMKIEWICZ, M
- [50] CORRELATED TRANSMISSION ELECTRON-MICROSCOPY (TEM) AND SCANNING ELECTRON-MICROSCOPY (SEM) OF SINGLE CELLSMIKROSKOPIE, 1976, 32 (1-2) : 17 - 25GEISSINGER, HDABANDOWITZ, HM