ION MICROANALYZER

被引：0

作者：

KARASEK, FW

机构：

来源：

RESEARCH-DEVELOPMENT | 1970年 / 21卷 / 02期

关键词：

D O I：

暂无

中图分类号：

C93 [管理学]; O22 [运筹学];

学科分类号：

070105 ; 12 ; 1201 ; 1202 ; 120202 ;

摘要：

引用

页码：32 / &

共 50 条

[21] QUANTITATIVE-ANALYSIS USING SPUTTERED NEUTRALS IN A SECONDARY ION MICROANALYZER
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[23] USE OF ION MICROANALYZER FOR CHARACTERIZATION OF BULK AND EPITAXIAL SILICON AND GALLIUM-ARSENIDE
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[29] A MODIFIED SEMI-QUANTITATIVE METHOD FOR DOPANT IN ZNS THIN-FILM WITH AN ION MICROANALYZER
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