RESOLUTION AND QUALITY OF IMAGE IN SEM

被引：0
|
作者：
KATAYAMA, Y [1 ]
SOEZIMA, H [1 ]
MASAKI, T [1 ]
机构：
[1] SHIMADZU SEISAKUSHO LTD,KYOTO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：285 / 285
页数：1
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