FEX REFLECTS PROGRESS

被引：0
|
作者：
不详
机构：
来源：
SVENSK PAPPERSTIDNING-NORDISK CELLULOSA | 1979年 / 82卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学]; TS [轻工业、手工业、生活服务业];
学科分类号：
0805 ; 080502 ; 0822 ;
摘要：
引用
收藏
页码：149 / 150
页数：2
相关论文
共 50 条
  • [41] Maye reflects
    Bancquart, Marie-Claire
    EUROPE-REVUE LITTERAIRE MENSUELLE, 2009, (962-63) : 314 - 315
  • [42] A WRITER REFLECTS
    HAZZARD, S
    BULLETIN OF THE ATOMIC SCIENTISTS, 1982, 38 (03) : 43 - 44
  • [43] THE CRITIC REFLECTS
    Kozloff, Max
    ARTFORUM INTERNATIONAL, 2024, 62 (10): : 114 - 121
  • [44] A DENTIST REFLECTS
    ALPER, MO
    JOURNAL OF THE AMERICAN DENTAL ASSOCIATION, 1966, 73 (02): : 259 - &
  • [45] A Headmaster Reflects
    不详
    BRITISH JOURNAL OF EDUCATIONAL PSYCHOLOGY, 1937, 7 : 325 - 326
  • [46] AN ARCHITECT REFLECTS
    JONES, E
    CHEMISTRY IN BRITAIN, 1989, 25 (02) : 111 - 112
  • [47] Magnetic and crystallographic properties of LaNi(5-x)Fex
    Tai, CY
    Tan, C
    Marasinghe, GK
    Pringle, OA
    James, WJ
    Chen, MX
    Yelon, WB
    Gebhardt, J
    Ali, N
    IEEE TRANSACTIONS ON MAGNETICS, 1999, 35 (05) : 3346 - 3348
  • [48] BUSINESS AND PROFESSIONAL SPEECH COMMUNICATION - ZELKO,HP AND DANCE,FEX
    HASKITT, HO
    QUARTERLY JOURNAL OF SPEECH, 1966, 52 (01) : 102 - 102
  • [49] PHOTO-IONIZATION MEASUREMENTS ON ISOLATED NIX AND FEX CLUSTERS
    ROHLFING, EA
    COX, DM
    KALDOR, A
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1983, 185 (MAR): : 125 - COLL
  • [50] Fex: Assisted Identification of Domain Features from C Programs
    Mueller, Patrick
    Narasimhan, Krishna
    Mezini, Mira
    IEEE 21ST INTERNATIONAL WORKING CONFERENCE ON SOURCE CODE ANALYSIS AND MANIPULATION (SCAM 2021), 2021, : 170 - 180
12345