MICROELECTRONICS IN INTERNATIONAL COMPETITION - A COMPARISON OF SEMICONDUCTOR TECHNOLOGY IN EUROPE, JAPAN AND THE USA

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作者：

BAUR, F

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SIEMENS REVIEW | 1980年 / 47卷 / 06期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页数：4

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