LIMITATION OF THE CLOCK FREQUENCY STABILITY BY THE INTERROGATION FREQUENCY NOISE - EXPERIMENTAL RESULTS

被引:8
|
作者
BARILLET, R
GIORDANO, V
VIENNET, J
AUDOIN, C
机构
[1] Laboratoire de l'Horloge Atomique, Unité Propre du CNRS Associée à l'Université Paris-Sud, 91405, Orsay, Cedex
关键词
D O I
10.1109/19.278565
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recent advances in atomic physics will make it possible to soon reach frequency stabilities in the range 10(-14)-10(15) tau-1/2 for passive atomic frequency standards. However, it is now recognized that the frequency noise in the interrogating microwave signal limits the frequency stability, approximately to the range 10(-12)-10(-13) tau-1/2, depending on the spectral purity of the VCXO and on the modulation frequency f(M). In order to experimentally investigate this effect, we have realized two identical microwave generators at 9192 MHz. These two microwave generators enable us to measure the PSD of their frequency fluctuations with or without additive frequency noise, and to separately characterize the limit of the frequency stability related to the interrogation frequency noise. The relation between the microwave frequency noise at 2nf(M) and the frequency stability limit has been verified: experimental results very precisely confirm the predictions of the model for slow modulation frequencies. In any case, the spurious effect is related only to the frequency noise present in the microwave interrogation at Fourier frequencies which are even harmonics of the modulation frequency.
引用
收藏
页码:276 / 280
页数:5
相关论文
共 50 条
  • [21] MEASUREMENT OF FREQUENCY STABILITY IN TIME AND FREQUENCY DOMAINS VIA FILTERING OF PHASE NOISE
    RUTMAN, J
    SAUVAGE, G
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1974, IM23 (04) : 515 - 518
  • [22] Frequency flicker limitation in dual oscillator phase noise measurement instruments
    Groslambert, J
    Rubiola, E
    Brunet, M
    Giordano, V
    2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2000, : 449 - 450
  • [23] Phase Noise Impact on the Short-Term Frequency Stability of a Frequency Source
    Wara, Md Tosicul
    Bhuvaneshwari, M. S.
    Raghavendra, M. R.
    Bhandiwad, Usha
    IETE JOURNAL OF RESEARCH, 2023, 69 (02) : 1140 - 1151
  • [24] Limitation of Gravitational Wave Detector Niobe Sensitivity by the Frequency Tracking Noise
    Frajuca, Carlos
    Bortoli, Fabio da Silva
    PROCEEDINGS OF THE 7TH INTERNATIONAL WORKSHOP ON ASTRONOMY AND RELATIVISTIC ASTROPHYSICS (IWARA 2016), 2017, 45
  • [25] Simultaneous bicolor interrogation in thulium optical clock providing very low systematic frequency shifts
    Golovizin, Artem A.
    Tregubov, Dmitry O.
    Fedorova, Elena S.
    Mishin, Denis A.
    Provorchenko, Daniil, I
    Khabarova, Ksenia Yu
    Sorokin, Vadim N.
    Kolachevsky, Nikolai N.
    NATURE COMMUNICATIONS, 2021, 12 (01)
  • [26] Frequency-stability performances of the pulsed optically pumped rubidium clock: Recent results and future perspectives
    Godone, Aldo
    Levi, Filippo
    Micalizio, Salvatore
    Bertacco, Elio K.
    Calosso, Claudio Eligio
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2007, 56 (02) : 378 - 382
  • [27] Improvement of the frequency stability of the cesium fountain clock by data processing
    Li, Zhiqi
    Yang, Ning
    Liu, Suyan
    Zhou, Wei
    AIP ADVANCES, 2021, 11 (12)
  • [28] Frequency stability measurement of a Raman-Ramsey Cs clock
    Castagna, N.
    Guerandel, S.
    Dahes, F.
    Zanon, T.
    de Clercq, E.
    Clairon, A.
    Dimarcq, N.
    PROCEEDINGS OF THE 2007 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM-JOINTLY WITH THE 21ST EUROPEAN FREQUENCY AND TIME FORUM, VOLS 1-4, 2007, : 67 - 70
  • [29] Effects of clock frequency stability on digital microwave radiometer performance
    Peng, Jinzheng
    Ruf, Christopher S.
    RADIO SCIENCE, 2010, 45
  • [30] A Cesium optical atomic clock with high optical frequency stability
    Tokuhira, Kazunari
    Suzuki, Fumitaka
    Yoshida, Masato
    Nakazawa, Masataka
    IEICE ELECTRONICS EXPRESS, 2012, 9 (18): : 1496 - 1503