BACKSCATTERING CARTRIDGE FOR THICKNESS DETERMINATION WITHIN ELECTRON-MICROSCOPE

被引：0

作者：

KINDT, M ^{[1
]}

NIEDRIG, H ^{[1
]}

机构：

[1] TECH UNIV BERLIN,PHYS INST 1,BERLIN,WEST GERMANY

来源：

OPTIK | 1974年 / 40卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：276 / 283

页数：8

共 50 条

[21] ELECTRON-MICROSCOPE
ANDO, H
JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1985, 30 (03): : 177 - 180
[22] DETERMINATION OF THE DIAMETER OF THE ELECTRON-PROBE OF A SCANNING ELECTRON-MICROSCOPE
NOVIKOV, YA
RAKOV, AV
STEKOLIN, IY
STRIZHKOV, IB
MEASUREMENT TECHNIQUES USSR, 1993, 36 (12): : 1348 - 1350
[23] OBSERVATION OF THICKNESS EXTINCTION CONTOURS WITH A POINT PROJECTION ELECTRON-MICROSCOPE
SMITH, DJ
OPTIK, 1977, 49 (01): : 133 - 136
[24] PERIODICITY IN THICKNESS OF ELECTRON-MICROSCOPE CRYSTAL-LATTICE IMAGES
FEJES, PL
IIJIMA, S
COWLEY, JM
ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (NOV1): : 710 - &
[25] DIFFRACTION FROM SUB-MICRON AREAS USING ELECTRON BACKSCATTERING IN A SCANNING ELECTRON-MICROSCOPE
DINGLEY, DJ
SCANNING ELECTRON MICROSCOPY, 1984, : 569 - 575
[26] DETERMINATION OF DISLOCATION LINE DIRECTION BY ELECTRON-MICROSCOPE STUDY
KARKINA, LY
PONOMAREV, MV
ANTONOVA, OV
TEYTEL, YI
FIZIKA METALLOV I METALLOVEDENIE, 1991, (11): : 173 - 182
[27] DETERMINATION OF CRYSTAL SYMMETRY IN THE TRANSMISSION ELECTRON-MICROSCOPE - A TUTORIAL
EADES, JA
JOURNAL OF METALS, 1987, 39 (07): : A15 - A15
[28] DETERMINATION OF DEPTH RESOLUTION OF STEREOSCOPIC SCANNING ELECTRON-MICROSCOPE
MAMCHEV, GV
SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1990, 57 (03): : 149 - 150
[29] LOCAL AND SURFACE-ANALYSIS WITHIN AN ANALYTICAL ELECTRON-MICROSCOPE
TREBBIA, P
UGARTE, D
MIKROCHIMICA ACTA, 1991, 2 (1-6) : 405 - 413
[30] SCANNING ELECTRON-MICROSCOPE
EVERHART, TE
HAYES, TL
SCIENTIFIC AMERICAN, 1972, 226 (01) : 54 - &

← 1 2 3 4 5 →