BACKSCATTERING CARTRIDGE FOR THICKNESS DETERMINATION WITHIN ELECTRON-MICROSCOPE

被引：0

作者：

KINDT, M ^{[1
]}

NIEDRIG, H ^{[1
]}

机构：

[1] TECH UNIV BERLIN,PHYS INST 1,BERLIN,WEST GERMANY

来源：

OPTIK | 1974年 / 40卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：276 / 283

页数：8

共 50 条

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