YOUNG INTERFERENCE-FRINGES IN ELECTRON-MICROSCOPY REVISITED

被引：3

作者：

ZEMLIN, F

WEISS, K

机构：

[1] Fritz-Haber-Institut der Max-Planck-Gesellschaft, W-14195 Berlin

来源：

ULTRAMICROSCOPY | 1993年 / 50卷 / 02期

关键词：

D O I：

10.1016/0304-3991(93)90002-F

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Young's interference fringes (YIF) have long been known as a helpful tool in image processing of electron micrographs by laser optics or computer. In this paper, the usefulness of the YIF method is given a critical look.

引用

页码：123 / 126

页数：4

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