YOUNG INTERFERENCE-FRINGES IN ELECTRON-MICROSCOPY REVISITED

被引：3
|
作者：
ZEMLIN, F
WEISS, K
机构：
[1] Fritz-Haber-Institut der Max-Planck-Gesellschaft, W-14195 Berlin
来源：
ULTRAMICROSCOPY | 1993年 / 50卷 / 02期
关键词：
D O I：
10.1016/0304-3991(93)90002-F
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Young's interference fringes (YIF) have long been known as a helpful tool in image processing of electron micrographs by laser optics or computer. In this paper, the usefulness of the YIF method is given a critical look.
引用
收藏
页码：123 / 126
页数：4
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