共 50 条
- [11] SILICON CARBIDE MICROSTRIP DETECTORS FOR HIGH RESOLUTION X-RAY SPECTROSCOPY ASTROPARTICLE, PARTICLE, SPACE PHYSICS AND DETECTORS FOR PHYSICS APPLICATIONS, 2012, 7 : 653 - 657
- [12] INVESTIGATION OF ENERGY STRUCTURE OF SI AND SIO2 BY ULTRASOFT X-RAY EMISSION AND ABSORPTION SPECTROSCOPY SOVIET PHYSICS SOLID STATE,USSR, 1967, 8 (07): : 1699 - +
- [13] X-RAY PHOTOELECTRON-SPECTROSCOPY INVESTIGATION ON THE CHEMICAL-STRUCTURE OF AMORPHOUS-SILICON NITRIDE (A-SINX) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (05): : 3048 - 3055
- [15] X-ray diffraction imaging investigation of silicon carbide on insulator structures Applied Physics A, 2002, 75 : 621 - 627
- [16] X-ray diffraction imaging investigation of silicon carbide on insulator structures APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 75 (05): : 621 - 627
- [18] Advances in silicon carbide X-ray detectors NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011, 652 (01): : 193 - 196
- [20] Estimation of the thickness of ultrathin silicon nitride films by x-ray photoelectron spectroscopy Muto, Akiko, 1600, (32):