A FULLY AUTOMATED STAGE FOR LOSS MEASUREMENTS OF OPTICAL WAVE-GUIDES

被引：1
|
作者：
KENSKY, ET
ZELMON, DE
机构：
[1] Wright Laboratory, Materials Directorate, Wright-Patterson AFB
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 07期
关键词：
D O I：
10.1063/1.1144012
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A novel test setup for making three-prism or out-of-plane scattering loss measurements for thin-film optical waveguides is described. The test structure is automated and provides quick, convenient and repeatable measurements. The setup is relatively easy to fabricate and employs several unique features which improve the accuracy and repeatability of the measurements including real-time coupling force monitoring.
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页码：1794 / 1796
页数：3
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