A LOW TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE

被引：41
|
作者：
KAUFMAN, HS
FANKUCHEN, I
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1949年 / 20卷 / 10期
关键词：
D O I：
10.1063/1.1741367
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：733 / 734
页数：2
相关论文
共 50 条
  • [31] Low temperature x-ray diffraction study on superconductivity
    Xue, Y.
    Kaneko, H.
    Tao, Q.
    Xu, Z.
    Takeda, N.
    Nemoto, Y.
    Goto, T.
    Suzuki, H.
    25TH INTERNATIONAL CONFERENCE ON LOW TEMPERATURE PHYSICS (LT25), PT 5A: SUPERCONDUCTIVITY, 2009, 150 (5a):
  • [32] LOW-TEMPERATURE X-RAY DIFFRACTION APPARATUS
    BOJKO, AA
    ACTA CRYSTALLOGRAPHICA, 1966, S 21 : A215 - &
  • [33] SYSTEM FOR LOW TEMPERATURE X-RAY DIFFRACTION STUDIES
    INTRATER, J
    APPEL, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (09): : 1065 - &
  • [34] FURTHER TECHNIQUES IN SINGLE-CRYSTAL X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES
    ABRAHAMS, SC
    COLLIN, RL
    LIPSCOMB, WN
    REED, TB
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (04): : 396 - 397
  • [35] X-ray diffraction in KDP crystal in the presence of temperature gradient
    V. Gh. Mirzoyan
    K. M. Gevorgyan
    P. A. Grigoryan
    T. G. Dovlatyan
    Journal of Contemporary Physics (Armenian Academy of Sciences), 2010, 45 : 145 - 150
  • [36] DETERMINATION OF MOLE FRACTION OF GAP IN GAASP SINGLE CRYSTAL BY A NEW X-RAY DIFFRACTION TECHNIQUE
    KISHINO, S
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (08) : 1113 - &
  • [37] X-ray diffraction in KDP crystal in the presence of temperature gradient
    Mirzoyan, V. Gh.
    Gevorgyan, K. M.
    Grigoryan, P. A.
    Dovlatyan, T. G.
    JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES, 2010, 45 (03) : 145 - 150
  • [38] A LOW-TEMPERATURE APPARATUS FOR SINGLE-CRYSTAL X-RAY GONIOMETERS
    HARDING, TT
    CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1956, 34 (03): : 371 - 375
  • [39] Powder X-ray diffraction applications with single crystal diffractometers
    He, Bob
    Noll, Bruce
    Campana, Charles
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2017, 73 : C556 - C556
  • [40] γ-Alumina:: a single-crystal X-ray diffraction study
    Smrcok, Lubomir
    Langer, Vratislav
    Krestan, Jan
    ACTA CRYSTALLOGRAPHICA SECTION C-STRUCTURAL CHEMISTRY, 2006, 62 : I83 - I84
12345