UHV-STM FOR CLEAVED SAMPLE

被引：0

作者：

TOKUMOTO, H ^{[1
]}

MIKI, K ^{[1
]}

OKAYAMA, S ^{[1
]}

MURAKAMI, H ^{[1
]}

WAKIYAMA, S ^{[1
]}

ANDO, K ^{[1
]}

机构：

[1] SEIKO INSTRUMENTS INC,ELECTROTECH LAB,TOKYO,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1990年 / 39卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：287 / 287

页数：1

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