X-RAY STRUCTURAL STUDIES OF EPITAXIAL NICKEL FILMS

被引:1
|
作者
THIEME, F [1 ]
KIRSTEIN, W [1 ]
机构
[1] UNIV HAMBURG,INST PHYS CHEM,D-2000 HAMBURG,FED REP GER
来源
关键词
D O I
10.1524/zpch.1976.102.1-4.119
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:119 / 125
页数:7
相关论文
共 50 条
  • [31] X-RAY STRUCTURAL AND IMIDAZOLE-BINDING STUDIES OF NICKEL BETA-OXOPORPHYRINS
    CONNICK, PA
    HALLER, KJ
    MACOR, KA
    INORGANIC CHEMISTRY, 1993, 32 (15) : 3256 - 3264
  • [32] Epitaxial GaAs X-ray detectors for X-ray astrophysics
    Bavdaz, M
    Owens, A
    Peacock, A
    HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS, 1999, 3768 : 451 - 456
  • [33] X-RAY STUDY OF STRUCTURAL PERFECTION OF EPITAXIAL PBS FILMS USING A 2-CRYSTAL SPECTROMETER
    PALATNIK, LS
    FUKS, MY
    ALAVERDOVA, OG
    SHPAKOVSKAYA, LP
    KRISTALLOGRAFIYA, 1977, 22 (03): : 608 - 614
  • [34] X-RAY STUDIES ON DEFORMED POLYPROPYLENE FILMS
    WANG, YR
    TENG, FE
    ZHANG, N
    WANG, YM
    JOURNAL OF MACROMOLECULAR SCIENCE-PHYSICS, 1995, B34 (1-2): : 87 - 93
  • [35] X-ray studies of doped polyaniline films
    Song, HH
    Park, DS
    Lee, C
    Rhee, SB
    Wang, X
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1997, 294 : 201 - 204
  • [36] Structural, infrared, X-ray photoelectron and raman spectral characterization of electrochromic nickel oxide films
    Wu, YG
    Wu, GM
    Ni, XY
    Wu, X
    FOURTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 2000, 4086 : 418 - 422
  • [37] In situ studies of epitaxial growth by synchrotron X-ray diffraction
    Braun, Wolfgang
    Ploog, Klaus H.
    SURFACE REVIEW AND LETTERS, 2006, 13 (2-3) : 155 - 166
  • [38] X-RAY ELECTRON STUDIES OF SOME NICKEL COMPOUNDS
    NEFEDOV, VI
    ZHUMADILOV, EK
    BAIER, L
    ZHURNAL NEORGANICHESKOI KHIMII, 1978, 23 (08): : 2113 - 2120
  • [39] X-ray studies on the nickel-chromium system
    Jette, ER
    Nordstrom, VH
    Queneau, B
    Foote, F
    TRANSACTIONS OF THE AMERICAN INSTITUTE OF MINING AND METALLURGICAL ENGINEERS, 1934, 111 : 361 - 373
  • [40] X-RAY DIFFRACTION STUDIES ON STRUCTURE OF ELECROLYTIC NICKEL
    SUONINEN, E
    ACTA CRYSTALLOGRAPHICA, 1966, S 21 : A186 - &