MICROWAVE-INDUCED METALLIZATION DAMAGE AND SURFACE SHORTS IN SEMICONDUCTORS

被引：2
|
作者：
AMADORI, RA
SIMONS, M
机构：
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1971年 / R 20卷 / 03期
关键词：
D O I：
10.1109/TR.1971.5216127
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：196 / &
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