SURFACE-PLASMON MICROSCOPY

被引:653
|
作者
ROTHENHAUSLER, B [1 ]
KNOLL, W [1 ]
机构
[1] MAX PLANCK INST POLYMERFORSCH,D-6500 MAINZ,FED REP GER
关键词
D O I
10.1038/332615a0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:615 / 617
页数:3
相关论文
共 50 条
  • [41] OPTICAL MEASUREMENTS OF THE SURFACE-PLASMON OF COPPER
    ROBUSTO, PF
    BRAUNSTEIN, R
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1981, 107 (02): : 443 - 449
  • [42] Surface-Plasmon Holographic Beam Shaping
    Dolev, Ido
    Epstein, Itai
    Arie, Ady
    PHYSICAL REVIEW LETTERS, 2012, 109 (20)
  • [43] SURFACE-PLASMON DISPERSION OF AG - REPLY
    LIEBSCH, A
    PHYSICAL REVIEW LETTERS, 1994, 72 (05) : 789 - 789
  • [44] HYDRODYNAMIC THEORY OF SURFACE-PLASMON DISPERSION
    HEINRICHS, J
    PHYSICAL REVIEW B, 1973, 7 (08) : 3487 - 3500
  • [45] IMMUNOASSAY BASED ON SURFACE-PLASMON OSCILLATIONS
    MAYO, CS
    HALLOCK, RB
    JOURNAL OF IMMUNOLOGICAL METHODS, 1989, 120 (01) : 105 - 114
  • [46] SURFACE-PLASMON RESONANCE AS A BIOANALYTICAL TOOL
    KOOYMAN, RPH
    DEBRUIJN, HE
    EENINK, RG
    GREVE, J
    JOURNAL OF MOLECULAR STRUCTURE, 1990, 218 : 345 - 350
  • [47] Near-field microscopy of surface-plasmon polaritons: Localization and internal interface imaging
    Bozhevolnyi, S. I.
    Smolyaninov, I. I.
    Zayats, A. V.
    Physical Review B: Condensed Matter, 51 (24):
  • [48] A semiconductor device for surface-plasmon generation
    Bousseksou, Adel
    Babuty, Arthur
    Tetienne, Jean-Philippe
    Moldovan-Doyen, Ioana
    Beaudoin, Gregoire
    Sirtori, Carlo
    Sagnes, Isabelle
    De Wilde, Yannick
    Colombelli, Raffaele
    2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS), 2010,
  • [49] SURFACE-PLASMON EXCITATION BY STEM ELECTRONS
    RIVACOBA, A
    APELL, P
    ECHENIQUE, PM
    PROGRESS IN SURFACE SCIENCE, 1994, 46 (2-3) : 187 - 199
  • [50] SURFACE-PLASMON ENERGY GAPS AND PHOTOLUMINESCENCE
    KITSON, SC
    BARNES, WL
    SAMBLES, JR
    PHYSICAL REVIEW B, 1995, 52 (15) : 11441 - 11445