CIRCUITS FOR PSEUDOEXHAUSTIVE TEST PATTERN GENERATION

被引：19

作者：

WANG, LT

MCCLUSKEY, EJ

机构：

[1] Stanford Univ, CA, USA

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1988年 / 7卷 / 10期

关键词：

Manu5cript received October 13; 1986; revised August 21. 1987. This work was supported in part by the National Science Foundation under Grant MCS-8200129 and in part by the AIDA Corporation under the Honors Co-operative Program (HCP) with Stanford University. The review of this paper was arranged by Associate Editor T. Williams;

D O I：

10.1109/43.7806

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1068 / 1080

页数：13

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