首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
SPECTROPHOTOMETER BASED ON A CHARGE-COUPLED DEVICE PHOTOARRAY DETECTOR
被引:12
|
作者
:
RATZLAFF, KL
论文数:
0
引用数:
0
h-index:
0
RATZLAFF, KL
机构
:
来源
:
ANALYTICAL CHEMISTRY
|
1980年
/ 52卷
/ 06期
关键词
:
D O I
:
10.1021/ac50056a033
中图分类号
:
O65 [分析化学];
学科分类号
:
070302 ;
081704 ;
摘要
:
引用
收藏
页码:916 / 920
页数:5
相关论文
共 50 条
[31]
CONDUCTIVELY CONNECTED CHARGE-COUPLED DEVICE
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
KRAMBECK, RH
STRAIN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STRAIN, RJ
SMITH, GE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SMITH, GE
PICKAR, KA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PICKAR, KA
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(01)
: 70
-
72
[32]
CHARGE-COUPLED DEVICE AND CHARGE-INJECTION DEVICE IMAGING
BARBE, DF
论文数:
0
引用数:
0
h-index:
0
机构:
USN, RES LAB, WASHINGTON, DC 20375 USA
USN, RES LAB, WASHINGTON, DC 20375 USA
BARBE, DF
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(01)
: 109
-
114
[33]
CCFET - ACTIVE CHARGE-COUPLED DEVICE
BOARD, K
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
BOARD, K
SHANNON, JM
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
SHANNON, JM
GILL, A
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
GILL, A
ELECTRONICS LETTERS,
1975,
11
(19)
: 452
-
453
[34]
A CHARGE-COUPLED DEVICE OBSERVATION OF CHARON
REITSEMA, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ARIZONA,LUNAR & PLANETARY LAB,TUCSON,AZ 85721
UNIV ARIZONA,LUNAR & PLANETARY LAB,TUCSON,AZ 85721
REITSEMA, HJ
论文数:
引用数:
h-index:
机构:
VILAS, F
SMITH, BA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ARIZONA,LUNAR & PLANETARY LAB,TUCSON,AZ 85721
UNIV ARIZONA,LUNAR & PLANETARY LAB,TUCSON,AZ 85721
SMITH, BA
ICARUS,
1983,
56
(01)
: 75
-
79
[35]
CHARACTERISTICS OF THE OVERLAID CHARGE-COUPLED DEVICE
BARSAN, RM
论文数:
0
引用数:
0
h-index:
0
BARSAN, RM
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(02)
: 123
-
134
[36]
HGCDTE CHARGE-COUPLED DEVICE TECHNOLOGY
KINCH, MA
论文数:
0
引用数:
0
h-index:
0
KINCH, MA
CHAPMAN, RA
论文数:
0
引用数:
0
h-index:
0
CHAPMAN, RA
SIMMONS, A
论文数:
0
引用数:
0
h-index:
0
SIMMONS, A
BUSS, DD
论文数:
0
引用数:
0
h-index:
0
BUSS, DD
BORRELLO, SR
论文数:
0
引用数:
0
h-index:
0
BORRELLO, SR
INFRARED PHYSICS,
1980,
20
(01):
: 1
-
20
[37]
Surface contamination of the charge-coupled device
YANG Jia-Min
论文数:
0
引用数:
0
h-index:
0
YANG Jia-Min
NuclearScienceandTechniques,
2001,
(02)
: 126
-
130
[38]
Manipulation of elementary charge in a silicon charge-coupled device
Fujiwara, A
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Basic Res Labs, Kanagawa 2430198, Japan
NTT, Basic Res Labs, Kanagawa 2430198, Japan
Fujiwara, A
Takahashi, Y
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Basic Res Labs, Kanagawa 2430198, Japan
NTT, Basic Res Labs, Kanagawa 2430198, Japan
Takahashi, Y
NATURE,
2001,
410
(6828)
: 560
-
562
[39]
Manipulation of elementary charge in a silicon charge-coupled device
Akira Fujiwara
论文数:
0
引用数:
0
h-index:
0
机构:
NTT Basic Research Laboratories,
Akira Fujiwara
Yasuo Takahashi
论文数:
0
引用数:
0
h-index:
0
机构:
NTT Basic Research Laboratories,
Yasuo Takahashi
Nature,
2001,
410
: 560
-
562
[40]
Low-light-level Raman spectroscopy using a charge-coupled device detector
Adjouri, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ANGERS,LAB PROPRIETES OPT MAT & APPLICAT,F-49045 ANGERS 01,FRANCE
Adjouri, C
Elliasmine, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ANGERS,LAB PROPRIETES OPT MAT & APPLICAT,F-49045 ANGERS 01,FRANCE
Elliasmine, A
LeDuff, Y
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ANGERS,LAB PROPRIETES OPT MAT & APPLICAT,F-49045 ANGERS 01,FRANCE
LeDuff, Y
SPECTROSCOPY,
1996,
11
(06)
: 44
-
&
←
1
2
3
4
5
→