EFFECTS OF DEEP-LEVEL IMPURITIES ON POPCORN NOISE OF BIPOLAR JUNCTION TRANSISTORS

被引:0
|
作者
HASEGAWA, T
ONODERA, K
机构
来源
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:65 / &
相关论文
共 50 条
  • [41] THE DEAL FAST-SURFACE STATES ARE PROBABLY DEEP-LEVEL IMPURITIES IN THE SEMICONDUCTOR
    KUMP, HJ
    BERNSTEIN, JB
    IEEE CIRCUITS & DEVICES, 1985, 1 (06): : 17 - 22
  • [42] INFLUENCE OF DEEP-LEVEL IMPURITIES ON ADMITTANCE OF GAP P+-N JUNCTIONS
    KRISPIN, P
    MAEGE, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 535 - 542
  • [43] INSTABILITY OF CURRENT IN EPITAXIAL GAAS FILMS COMPENSATED WITH SEVERAL DEEP-LEVEL IMPURITIES
    ALEKSANDROVA, GA
    ZAVADSKII, YI
    KORNILOV, BV
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 9 (04): : 489 - 490
  • [44] Deep-level impurities in CdTe/CdS thin-film solar cells
    Balcioglu, A
    Ahrenkiel, RK
    Hasoon, F
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (12) : 7175 - 7178
  • [45] EFFECT OF DEEP-LEVEL IMPURITIES ON THE GRAIN-BOUNDARY POTENTIAL OF A POLYCRYSTALLINE SEMICONDUCTOR
    CHATTOPADHYAY, P
    HALDAR, DP
    CHAKRABARTI, S
    RAY, M
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1994, 142 (01): : 117 - 125
  • [46] Deep level defects which limit current gain in 4H SiC bipolar junction transistors
    Cochrane, C. J.
    Lenahan, P. M.
    Lelis, A. J.
    APPLIED PHYSICS LETTERS, 2007, 90 (12)
  • [47] Deep-level trapping centers in heterostructures for GaN field-effect transistors
    Andreev, M. S.
    Velikovskii, L. E.
    Kitichenko, T. S.
    Kolesnikova, T. G.
    Korovin, A. P.
    Mokerov, V. G.
    Yakunin, S. N.
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 2007, 52 (07) : 819 - 834
  • [48] Deep-level trapping centers in heterostructures for GaN field-effect transistors
    M. S. Andreev
    L. E. Velikovskii
    T. S. Kitichenko
    T. G. Kolesnikova
    A. P. Korovin
    V. G. Mokerov
    S. N. Yakunin
    Journal of Communications Technology and Electronics, 2007, 52 : 819 - 825
  • [49] Effects of spacer thickness on noise performance of bipolar transistors
    Lee, WK
    Lam, S
    Chan, MS
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (09) : 1534 - 1537
  • [50] Low frequency noise in nun and pnp polysilicon emitter bipolar junction transistors
    Deen, MJ
    QUANTUM 1/F NOISE AND OTHER LOW FREQUENCY FLUCTUATIONS IN ELECTRONIC DEVICES, 1999, 466 : 105 - 122