共 50 条
- [1] Identification of deep level defects in SiC bipolar junction transistors SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2, 2006, 527-529 : 567 - 569
- [2] Deep-Level Defects and Impurities in InGaN Alloys PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2020, 257 (04):
- [5] INSULATING PROPERTIES OF SEMICONDUCTORS COMPENSATED BY DEEP-LEVEL IMPURITIES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1977, 11 (08): : 947 - 948
- [9] Frequency conversion of flicker noise in bipolar junction transistors PROCEEDINGS OF THE 1998 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 1998, : 176 - 179